why are “Disk Stress (LOGO)” and “Rotational Rate Test (LOGO)” tests failing on VHLK (WHQL)? RRS feed

  • Question

  • I have written a driver, which sits on top MPIO. In my driver I have created device object of "FILE_DEVICE_MASS_STORAGE" type and handling most of required "IRP_MJ_XXX" callbacks. I am planing to sign my driver from Microsoft. So I am running VHLK(WHQL) tests on my driver. All DF-PNP test cases are passing after applying filter. But don't know why "Disk Stress (LOGO)" and "Rotational Rate Test (LOGO)" tests failing. Do I need to handle any IOCTL coming from Disk.sys?

    my question is "what should I add in my code so that those two above mention VHLK test cases pass?"

    please let me know if any further information required.


    Tuesday, May 5, 2020 12:24 PM